Keyword : deep level


Two-Dimensional Cyclic Bias Device Simulator and Its Application to GaAs HJFET Pulse Pattern Effect Analysis
Yuji TAKAHASHI Kazuaki KUNIHIRO Yasuo OHNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 917-923
Type of Manuscript:  Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
device simulationcyclic bias simulatorpulse pattern effectdeep levelGaAs HJFET
 Summary | Full Text:PDF

Computer-Aided Analysis of GaAs MESFETs with p-Buffer Layer on the Semi-Insulating Substrate
Kazushige HORIO Naohisa OKUMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/10/25
Vol. E75-C  No. 10 ; pp. 1140-1145
Type of Manuscript:  Special Section PAPER (Special Issue on Compound Semiconductor Integrated Circuits)
Category: 
Keyword: 
GaAs MESFETp-buffer layerdeep levelsmall-signal parametersdrain-current transient
 Summary | Full Text:PDF