Keyword : de-embedding


Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
Korkut Kaan TOKGOZ Kimsrun LIM Seitarou KAWAI Nurul FAJRI Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/01/01
Vol. E98-C  No. 1 ; pp. 35-44
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
crossing transmission linede-embeddingcharacterizationmillimeter-wavereduced port
 Summary | Full Text:PDF(2.2MB)

Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique
An-Sam PENG Ming-Hsiang CHO Yueh-Hua WANG Meng-Fang WANG David CHEN Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/10/01
Vol. E96-C  No. 10 ; pp. 1289-1293
Type of Manuscript:  Special Section PAPER (Special Section on Emerging Technologies and Applications for Microwave and Millimeter-Wave Systems)
Category: 
Keyword: 
3D ICTSVde-embeddingTEGsmicrowaveRF modeling
 Summary | Full Text:PDF(1.6MB)

Evaluation of L-2L De-Embedding Method Considering Misalignment of Contact Position for Millimeter-Wave CMOS Circuit Design
Qinghong BU Ning LI Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5 ; pp. 942-948
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
misalignmentde-embeddingmillimeter waveL-2L
 Summary | Full Text:PDF(1.7MB)

Analysis of De-Embedding Error Cancellation in Cascade Circuit Design
Kyoya TAKANO Ryuichi FUJIMOTO Kosuke KATAYAMA Mizuki MOTOYOSHI Minoru FUJISHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/10/01
Vol. E94-C  No. 10 ; pp. 1641-1649
Type of Manuscript:  Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Measurement Techniques
Keyword: 
de-embeddingTRLcascade circuit
 Summary | Full Text:PDF(1.9MB)

A De-Embedding Method Using Different-Length Transmission Lines for mm-Wave CMOS Device Modeling
Naoki TAKAYAMA Kota MATSUSHITA Shogo ITO Ning LI Keigo BUNSEN Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6 ; pp. 812-819
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
de-embeddingS-parameter measurementmm-waveRF CMOStransmission line
 Summary | Full Text:PDF(3.3MB)

Evaluation of a Multi-Line De-Embedding Technique up to 110 GHz for Millimeter-Wave CMOS Circuit Design
Ning LI Kota MATSUSHITA Naoki TAKAYAMA Shogo ITO Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/02/01
Vol. E93-A  No. 2 ; pp. 431-439
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
CMOS amplifiertransmission linemillimeter wavede-embedding60 GHz
 Summary | Full Text:PDF(1.2MB)

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C  No. 9 ; pp. 1157-1162
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category: 
Keyword: 
de-embeddingmicrowaveMOSFETsnoiseRFsilicon
 Summary | Full Text:PDF(717.4KB)

Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs
Ming-Hsiang CHO Yueh-Hua WANG Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/09/01
Vol. E90-C  No. 9 ; pp. 1708-1714
Type of Manuscript:  Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Active Devices/Circuits
Keyword: 
calibrationde-embeddingCMOSmicrowaveparasiticsS-parameters
 Summary | Full Text:PDF(1.7MB)

De-Embedding Technique for the Extraction of Parasitic and Stray Capacitances from 1-Port Measurements
Umberto PAOLETTI Osami WADA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/06/01
Vol. E90-B  No. 6 ; pp. 1298-1304
Type of Manuscript:  Special Section PAPER (Special Section on 2nd Pan-Pacific EMC Joint Meeting--PPEMC'06--)
Category: Printed Circuit Board
Keyword: 
capacitancemeasurementparasiticde-embedding
 Summary | Full Text:PDF(529.9KB)

A Simple Adapter De-Embedding Method in the Six-Port Calibration Process Using a Scalar Analyzer
Toshiyuki YAKABE Hatsuo YABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/06/25
Vol. E77-C  No. 6 ; pp. 925-929
Type of Manuscript:  Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
Category: 
Keyword: 
de-embeddingsix-portmicrowave measurementcalibration
 Summary | Full Text:PDF(390KB)