Keyword : current testing


A CMOS Built-In Current Sensor for IDDQ Testing
Jeong Beom KIM Seung Ho HONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/06/01
Vol. E89-C  No. 6 ; pp. 868-870
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
IDDQ testingcurrent testingBICSreliability
 Summary | Full Text:PDF

Novel Built-In Current Sensor for On-Line Current Testing
Chul Ho KWAK Jeong Beom KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/09/01
Vol. E86-C  No. 9 ; pp. 1898-1902
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
built-in current sensorcurrent testingVLSIreliability
 Summary | Full Text:PDF