Keyword : current testing (IDDQ testing)


A Method of Current Testing for CMOS Digital and Mixed-Signal LSIs
Yukiya MIURA Sachio NAITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 845-852
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
current testing (IDDQ testing)built-in testdesign for testabilitydigital and mixed-signal circuit testing
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