Keyword : current fluctuation

Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs
Nobuyuki SANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8 ; pp. 1203-1211
Type of Manuscript:  INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Device Modeling and Simulation
Monte Carlo simulationcurrent fluctuationthermal noiseshot noisecentral limit theorem
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