Keyword : current density


Scalability of Vertical MOSFETs in Sub-10 nm Generation and Its Mechanism
Tetsuo ENDOH Yuto NORIFUSA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 594-597
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Vertical MOSFETsub-10 nmdriving currentcutoff leakage currentcurrent density
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Optical Observation of Arc Discharges between Electrical Contacts Breaking at Low Speed in DC42 V Resistive Circuit
Junya SEKIKAWA Takayoshi KUBONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/08/01
Vol. E89-C  No. 8 ; pp. 1147-1152
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005))
Category: Arc Discharge & Related Phenomena
Keyword: 
arc dischargeelectrical contactbreaking archigh-speed cameracurrent density
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Fabrication of Double-Sided YBa2Cu3O7 Films on CeO2-Buffered Sapphire Substrates by MOD Process
Mitsugu SOHMA Kunio KAMIYA Kenichi TSUKADA Iwao YAMAGUCHI Wakichi KONDO Susumu MIZUTA Takaaki MANABE Toshiya KUMAGAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/02/01
Vol. E89-C  No. 2 ; pp. 182-185
Type of Manuscript:  Special Section PAPER (Special Section on Superconducting High-frequency Devices)
Category: 
Keyword: 
MODdouble-sided YBCO filmcurrent densitysurface resistance
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Constriction Resistance of Two Conducting Spots
Hitoshi NISHIYAMA Mitsunobu NAKAMURA Isao MINOWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/10/25
Vol. E77-C  No. 10 ; pp. 1597-1605
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Electromechanical Devices)
Category: Simulation and AI-Technology
Keyword: 
contact spotsconstriction resistanceboundary element methodcurrent densityinteraction
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