Keyword : crosstalk noise


Multi-Ported Register File for Reducing the Impact of PVT Variation
Yuuichirou IKEDA Masaya SUMITA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3 ; pp. 356-363
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Signal Integrity and Variability
Keyword: 
multi-ported register fileself timing circuitsPVT variationcrosstalk noise
 Summary | Full Text:PDF

Crosstalk Noise Optimization by Post-Layout Transistor Sizing
Masanori HASHIMOTO Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3251-3257
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Physical Design
Keyword: 
crosstalk noisecapacitive coupling noisetransistor sizinggate sizingpost-layout optimization
 Summary | Full Text:PDF

Crosstalk Noise Estimation for Generic RC Trees
Masanori HASHIMOTO Masao TAKAHASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 2965-2973
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Parasitics and Noise
Keyword: 
crosstalk noisecapacitive couplingnoise estimationsignal integrity
 Summary | Full Text:PDF

Measurement-Based Line Parameter Extraction Method for Multiple-Coupled Lines in Printed Circuit Boards
Yong-Ju KIM Han-Sub YOON Gyu MOON Seongsoo LEE Jae-Kyung WEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/08/01
Vol. E86-C  No. 8 ; pp. 1649-1656
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: 
Keyword: 
crosstalk noisesignal integrityline parameter extraction method
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Non-uniform Multi-Layer IC Interconnect Transmission Line Characterization for Fast Signal Transient Simulation of High-Speed/High-Density VLSI Circuits
Woojin JIN Hanjong YOO Yungseon EO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 955-966
Type of Manuscript:  Special Section PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
interconnectsubstrate effectshielding effectsignal integritysignal delaycrosstalk noise
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A Layout System for Mixed A/D Standard Cell LSI's
Ikuo HARADA Hitoshi KITAZAWA Takao KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/03/25
Vol. E75-C  No. 3 ; pp. 322-332
Type of Manuscript:  Special Section PAPER (Special Issue on Analog LSI and Related Technology)
Category: 
Keyword: 
analog layoutfloorplanplacementglobal routingchannel routingcrossoverscrosstalk noise
 Summary | Full Text:PDF