Keyword : cross-sectional transmission electron microscopy


Interfacial Study of Nb Josephson Junctions with Overlayer Structure
Shin'ichi MOROHASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8 ; pp. 1150-1156
Type of Manuscript:  INVITED PAPER (Special Section on Superconducting Devices)
Category: LTS
Keyword: 
Josephson junctionstunneling barriersecondary ion mass spectroscopycross-sectional transmission electron microscopyinterfaceadsorbed water vapor layer
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