Keyword : coupling faults


An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 639-646
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
testingdiagnosiscoupling faultsstuck-at faults March test algorithmbuilt-in self-test (BIST)built-in self-diagnosis (BISD)automated march-based test algorithmSRAM
 Summary | Full Text:PDF

An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
Jin-Fu LI Chao-Da HUANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A  No. 12 ; pp. 2703-2711
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Memory Design and Test
Keyword: 
diagnosisrandom access memoriesMarch testbuilt-in self-diagnosiscoupling faults
 Summary | Full Text:PDF