Keyword : coupled-cell faults


RAM BIST
Jacob SAVIR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/01/01
Vol. E84-C  No. 1 ; pp. 102-107
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
memory teststuck-at faultcoupled-cell faultspattern-sensitive faultstest lengthconfidence levelMarkov chain
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