Keyword : contact trace

Deformation of Crystal Morphology in Tin Plated Contact Layer Caused by Loading
Terutaka TAMAI Shigeru SAWADA Yasuhiro HATTORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/09/01
Vol. E95-C  No. 9 ; pp. 1473-1480
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices - Papers selected from International Session on Electro-Mechanical Devices 2011 (IS-EMD2011) and other recent research results -)
tin plated contactscontact resistancecontact loadcontact traceconnectorFEM
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