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Correlation between Contact Resistance Characteristics and Scanning Tunneling Microscopy Images for Ag-Pd Alloy with Some Example Additives
Terutaka TAMAI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C
No. 8 ;
pp. 1559-1565
Type of Manuscript:
Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--)
Category: Contact Phenomena
Keyword:
STM, contact resistance, Ag-Pd-Cr alloy, Ag-Pd-Mg alloy, | | | Summary | Full Text:PDF | |
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