Keyword : compact model


Efficiency Analysis of SiC-MOSFET-Based Bidirectional Isolated DC/DC Converters
Atsushi SAITO Kenshiro SATO Yuta TANIMOTO Kai MATSUURA Yutaka SASAKI Mitiko MIURA-MATTAUSCH Hans Jürgen MATTAUSCH Yoshifumi ZOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9 ; pp. 1065-1070
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
circuit simulationcompact modelDC/DC converterSiC-MOSFEToptimizationconversion efficiency
 Summary | Full Text:PDF

Compact Modeling of Injection Enhanced Insulated Gate Bipolar Transistor Valid for Optimization of Switching Frequency
Takao YAMAMOTO Masataka MIYAKE Uwe FELDMANN Hans JÜRGEN MATTAUSCH Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/10/01
Vol. E97-C  No. 10 ; pp. 1021-1027
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
IGBTHiSIMSPICEcompact model
 Summary | Full Text:PDF

Compact Modeling of Expansion Effects in LDMOS
Takahiro IIZUKA Takashi SAKUDA Yasunori ORITSUKI Akihiro TANAKA Masataka MIYAKE Hideyuki KIKUCHIHARA Uwe FELDMANN Hans Jurgen MATTAUSCH Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/11/01
Vol. E95-C  No. 11 ; pp. 1817-1823
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
high-voltage MOSFETsbreakdownhigh-electric-field phenomenacompact modelsurface potential
 Summary | Full Text:PDF

Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions
Masataka MIYAKE Junichi NAKASHIMA Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/10/01
Vol. E95-C  No. 10 ; pp. 1682-1688
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
high-level injectionp-i-n diodereverse recoverycarrier distributioncompact modelcircuit simulationSPICE
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Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design
Norio SADACHIKA Shu MIMURA Akihiro YUMISAKI Kou JOHGUCHI Akihiro KAYA Mitiko MIURA-MATTAUSCH Hans Jurgen MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/03/01
Vol. E94-C  No. 3 ; pp. 361-367
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
circuit simulationcompact modelDFMreliability
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Degraded Frequency-Tuning Range and Oscillation Amplitude of LC-VCOs due to the Nonquasi-Static Effect in MOS Varactors
Masataka MIYAKE Daisuke HORI Norio SADACHIKA Uwe FELDMANN Mitiko MIURA-MATTAUSCH Hans Jurgen MATTAUSCH Tatsuya OHGURO Takahiro IIZUKA Masahiko TAGUCHI Shunsuke MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/06/01
Vol. E92-C  No. 6 ; pp. 777-784
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
accumulation-modeMOS varactorcarrier-transit delaynonquasi-static effectcompact modelsurface potentialcircuit simulationLC-VCOfrequency-tuning rangeFTRoscillation amplitude
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Analytical and Numerical Study of the Impact of Halos on Surrounding-Gate MOSFETs
Zunchao LI Ruizhi ZHANG Feng LIANG Zhiyong YANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4 ; pp. 558-563
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatecompact modelhalo
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Characterization and Modeling of Gate-Induced-Drain-Leakage
Fabien GILIBERT Denis RIDEAU Alexandre DRAY Francois AGUT Michel MINONDO Andre JUGE Pascal MASSON Rachid BOUCHAKOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 829-837
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
GIDLcompact modelMOSFETelectric fieldtrap assisted tunneling
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On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs
Ming-Ta YANG Yo-Jen WANG Patricia Pei-Chen HO Tzu-Jin YEH Darryl Chih-Wei KUO Chin-Wei KUO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 838-844
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
BSIM3bulk effectcompact modelMOSFETsradio frequency
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Model for Thermal Noise in Semiconductor Bipolar Transistors at Low-Current Operation as Multidimensional Diffusion Stochastic Process
Yevgeny V.MAMONTOV Magnus WILLANDER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Vol. E80-C  No. 7 ; pp. 1025-1042
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
silicon bipolar transistorcompact modelcarriervelocity-fluctuation noiseIto's stochastic differential equationdiffusion stochastic processsemiconductor-device simulationspectral densityhigh-frequency noisecircuit simulation
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Thermal Noise in Silicon Bipolar Transistors and Circuits for Low-Current Operation--Part : Compact Device Model--
Yevgeny V. MAMONTOV Magnus WILLANDER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/12/25
Vol. E78-C  No. 12 ; pp. 1761-1772
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
silicon bipolar transistorcompact modelthermal noisecarrier-velocity fluctuationsOrnstein-Uhlenbeck stationary stochastic process"microplasma" noiseItô's non-linear stochastic-differential-equation system
 Summary | Full Text:PDF