Keyword : common centroid


Design Methodology for Yield Enhancement of Switched-Capacitor Analog Integrated Circuits
Pei-Wen LUO Jwu-E CHEN Chin-Long WEY 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/01/01
Vol. E94-A  No. 1 ; pp. 352-361
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
yield enhancementmismatchcommon centroidspatial correlationprocess variationplacement optimization
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