Keyword : collapse

2D Device Simulation of AlGaN/GaN HFET Current Collapse Caused by Surface Negative Charge Injection
Yusuke IKAWA Yorihide YUASA Cheng-Yu HU Jin-Ping AO Yasuo OHNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/08/01
Vol. E93-C  No. 8 ; pp. 1218-1224
Type of Manuscript:  Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM 2009)
Category: GaN-based Devices
Keyword: 
AlGaN/GaN HFET, collapse, virtual gate, pinning, surface states, simulation, 
 Summary | Full Text:PDF
River Levee Change Detection Using Distributed Fiber Optic Strain Sensor
Hiroshi NARUSE Yasuomi UCHIYAMA Toshio KURASHIMA Shuji UNNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/03/25
Vol. E83-C  No. 3 ; pp. 462-467
Type of Manuscript:  Special Section PAPER (Special Issue on Optical Fiber Sensors)
Category: System Applications and Field Tests
Keyword: 
river levee, slope face, collapse, strain, fiber optic sensor, monitoring, 
 Summary | Full Text:PDF