Keyword : charge trap memories


Possibility of Metal-Oxide-Nitride-Oxide-Semiconductor Memories for Long Lifespan Archive Memories
Hiroki SHIRAKAWA Keita YAMAGUCHI Masaaki ARAIDAI Katsumasa KAMIYA Kenji SHIRAISHI 
Publication:   
Publication Date: 2017/10/01
Vol. E100-C  No. 10 ; pp. 928-933
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MONOSarchive memoriescharge trap memoriesfirst principals calculation
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