Keyword : characterizations

Practical Design and Modeling Procedure of Test Structures for Microwave Bare-Chip Devices
Masanori SHIMASUE Hitoshi AOKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/01/01
Vol. E87-C  No. 1 ; pp. 60-65
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
 Summary | Full Text:PDF(427.5KB)

Bias and Geometry Dependent Flicker Noise Characterization for n-MOSFET's
Hitoshi AOKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/02/01
Vol. E85-C  No. 2 ; pp. 408-414
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
flicker noise1/f noisesimulationSPICEcharacterizations
 Summary | Full Text:PDF(532.4KB)

Single-Parameter Characterizations of Schur Stability Property
Takehiro MORI Hideki KOKAME 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/08/01
Vol. E84-A  No. 8 ; pp. 2061-2064
Type of Manuscript:  LETTER
Category: Systems and Control
Schur polynomialSchur matrixcharacterizationsrobustnessfree parameter
 Summary | Full Text:PDF(135.1KB)