Keyword : cell transistors


Advanced Characterization Method for Sub-Micron DRAM Cell Transistors
Ikuo KURACHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4 ; pp. 618-623
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
DRAMcell transistorstest structureparameter extractionparasitic resistance
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