Keyword : capture power

A Novel ATPG Method for Capture Power Reduction during Scan Testing
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/09/01
Vol. E90-D  No. 9 ; pp. 1398-1405
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testing, capture power, X-bit, IR-drop, 
 Summary | Full Text:PDF
A New Method for Low-Capture-Power Test Generation for Scan Testing
Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/05/01
Vol. E89-D  No. 5 ; pp. 1679-1686
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testing, capture power, X-bit, IR-drop, 
 Summary | Full Text:PDF