Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-DNo. 9 ;
pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-DNo. 5 ;
pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,