Keyword : built-in self-testing


Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing
Kiyoshi FURUYA Naoki NAKAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 675-681
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Built-in Self-Test
Keyword: 
cellular automatabuilt-in self-testingTPG circuitrandom pattern generation
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