Keyword : broad-side test application


Hybrid Test Application in Partial Skewed-Load Scan Design
Yuki YOSHIKAWA Tomomi NUWA Hideyuki ICHIHARA Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12 ; pp. 2571-2578
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
delay testingdesign-for-testabilityskewed-load test applicationbroad-side test applicationpartial skewed-load scan designhybrid test application
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