Keyword : bridging faults


A Method for Diagnosing Bridging Fault between a Gate Signal Line and a Clock Line
Yoshinobu HIGAMI Senling WANG Hiroshi TAKAHASHI Shin-ya KOBAYASHI Kewal K. SALUJA 
Publication:   
Publication Date: 2017/09/01
Vol. E100-D  No. 9 ; pp. 2224-2227
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
fault diagnosisbridging faultsclock lines
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On Detection of Bridge Defects with Stuck-at Tests
Kohei MIYASE Kenta TERASHIMA Xiaoqing WEN Seiji KAJIHARA Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 683-689
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
defect based testingtest vector generationtest vector modificationbridging faultsfault extraction
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Test Sequence Generation for Test Time Reduction of IDDQ Testing
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 537-543
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
IDDQ testingbridging faultsswitching currentsupply current testCMOS circuits
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Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 564-570
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
bridging faultsCMOS synchronous sequential circuitsfault analysistesting
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An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure
Yukiya MIURA Hiroshi YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/10/25
Vol. E81-D  No. 10 ; pp. 1072-1078
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
IDDQ testingbridging faultsflip-flopsfault analysis
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