Keyword : bootstrapped switch


Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3 ; pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
gate-oxide reliabilitysample-and-hold amplifierdielectric breakdownbootstrapped switchswitched-capacitor circuit
 Summary | Full Text:PDF(1.1MB)

Reduction of Bootstrapped Switch Area Consumption Using Pre-Charge Phase
Retdian A. NICODIMUS Shigetaka TAKAGI Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/02/01
Vol. E91-A  No. 2 ; pp. 476-482
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
track-and-hold circuitbootstrapped switch
 Summary | Full Text:PDF(404.4KB)