Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A
No. 12 ;
pp. 2292-2300
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword:
post-silicon tuning, body bias clustering, process variation, body biasing, statistical static timing analysis, |
