Keyword : bidirectional stressing


A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6 ; pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
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