Keyword : automatic test equipment


Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing
Masahiro ISHIDA Toru NAKURA Takashi KUSAKA Satoshi KOMATSU Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/10/01
Vol. E99-C  No. 10 ; pp. 1219-1225
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
power integritypower supply voltage controloverkills and underkillsdelay fault testingautomatic test equipment
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A Novel Dictionary-Based Method for Test Data Compression Using Heuristic Algorithm
Diancheng WU Jiarui LI Leiou WANG Donghui WANG Chengpeng HAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/06/01
Vol. E99-C  No. 6 ; pp. 730-733
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
automatic test equipmenttest data compressionheuristic algorithmmaximum clique problemdictionary-based compression
 Summary | Full Text:PDF(948.8KB)

An Algorithm to Evaluate Imbalances of Quadrature Mixers
Koji ASAMI Michiaki ARAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4 ; pp. 1223-1229
Type of Manuscript:  PAPER
Category: Measurement Technology
Keyword: 
automatic test equipmentquadrature mixersingle side band signalFourier transform
 Summary | Full Text:PDF(1.2MB)

Technique to Improve the Performance of Time-Interleaved A-D Converters with Mismatches of Non-linearity
Koji ASAMI Takahide SUZUKI Hiroyuki MIYAJIMA Tetsuya TAURA Haruo KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/02/01
Vol. E92-A  No. 2 ; pp. 374-380
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
time-interleaved A-D convertersnon-linearityforeground calibrationdigital error correctionautomatic test equipment
 Summary | Full Text:PDF(730.2KB)

Test Generation for Test Compression Based on Statistical Coding
Hideyuki ICHIHARA Atsuhiro OGAWA Tomoo INOUE Akio TAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1466-1473
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
VLSI testtest compressionstatistical codetest generationautomatic test equipment
 Summary | Full Text:PDF(298.2KB)