Keyword : automatic measurement


A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement
Ming-Hsiang CHO Guo-Wei HUANG Chia-Sung CHIU Kun-Ming CHEN An-Sam PENG Yu-Min TENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 845-850
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
automatic measurementcascade configurationon-wafer de-embeddingsiliconS-parameters
 Summary | Full Text:PDF

A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement
Han-Yu CHEN Kun-Ming CHEN Guo-Wei HUANG Chun-Yen CHANG Tiao-Yuan HUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 726-732
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
threshold voltageeffective channel lengthchannel mobilityS-parameterautomatic measurement
 Summary | Full Text:PDF