Keyword : automatic inspection

An Efficient Algorithm for Detecting Singularity in Signals Using Wavelet Transform
Huiqin JIANG Takashi YAHAGI Jianming LU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/10/01
Vol. E86-A  No. 10 ; pp. 2639-2649
Type of Manuscript:  PAPER
Category: Digital Signal Processing
automatic inspectionwavelet transformsingularity detectionLipschitz exponent
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Hybrid Defect Detection Method Based on the Shape Measurement and Feature Extraction for Complex Patterns
Hilario Haruomi KOBAYASHI Yasuhiko HARA Hideaki DOI Kazuo TAKAI Akiyoshi SUMIYA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/07/25
Vol. E83-D  No. 7 ; pp. 1338-1345
Type of Manuscript:  Special Section PAPER (Special Issue on Machine Vision Applications)
printed circuit boardimage processingshape measurementfeature extractionautomatic inspection
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