Keyword : at-speed testing


Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing
Zhou JIANG Guiming LUO Kele SHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9 ; pp. 1071-1079
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
scan testscan segmentationlower power testingcomplex networks clusteringdesign for testabilityat-speed testing
 Summary | Full Text:PDF(731.4KB)

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testingATPGIR-droptest power reductionlow power test
 Summary | Full Text:PDF(1.6MB)

Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors
Masato NAKAZATO Michiko INOUE Satoshi OHTAKE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 763-770
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
software-based self-testprocessortest program templatedesign for testabilityerror maskingat-speed testing
 Summary | Full Text:PDF(522.6KB)

Channel-Count-Independent BIST for Multi-Channel SerDes
Kouichi YAMAGUCHI Muneo FUKAISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3 ; pp. 314-319
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Interface and Interconnect Techniques
Keyword: 
SerDesBISTat-speed testingPRBSmulti-channel synchronization
 Summary | Full Text:PDF(657.5KB)

Hybrid BIST Design for n-Detection Test Using Partially Rotational Scan
Kenichi ICHINO Takeshi ASAKAWA Satoshi FUKUMOTO Kazuhiko IWASAKI Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1490-1497
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
hybrid BISTunmodeled faultn-detection testpartially rotational scanat-speed testing
 Summary | Full Text:PDF(417.2KB)