Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-DNo. 9 ;
pp. 2003-2011 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: at-speed testing, ATPG, IR-drop, test power reduction, low power test,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/03/01 Vol. E89-CNo. 3 ;
pp. 314-319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era) Category: Interface and Interconnect Techniques Keyword: SerDes, BIST, at-speed testing, PRBS, multi-channel synchronization,