Keyword : alpha particle


Multiple-Bit-Upset and Single-Bit-Upset Resilient 8T SRAM Bitcell Layout with Divided Wordline Structure
Shusuke YOSHIMOTO Takuro AMASHITA Shunsuke OKUMURA Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/10/01
Vol. E95-C  No. 10 ; pp. 1675-1681
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
SRAMsoft errormultiple-bit upset (MBU)single-event upset (SEU)error correction coding (ECC)alpha particleneutron particle
 Summary | Full Text:PDF

Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process
Shusuke YOSHIMOTO Takuro AMASHITA Shunsuke OKUMURA Koji NII Masahiko YOSHIMOTO Hiroshi KAWAGUCHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/08/01
Vol. E95-A  No. 8 ; pp. 1359-1365
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
SRAMsingle-event upset (SEU)bit error rate (BER)soft error rate (SER)neutron particlealpha particle
 Summary | Full Text:PDF