Keyword : adjacent lines


SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines
Jun YAMASHITA Hiroyuki YOTSUYANAGI Masaki HASHIZUME Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/12/01
Vol. E96-A  No. 12 ; pp. 2561-2567
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
open faultsadjacent linestest pattern generationcoupling capacitanceSAT-based ATPG
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