Keyword : adjacency test


Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9 ; pp. 2135-2142
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
two-pattern testingadjacency testdeterministic test generationBIST
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