Keyword : acyclic sequential circuits


A Method of Test Generation for Acyclic Sequential Circuits Using Single Stuck-at Fault Combinational ATPG
Hideyuki ICHIHARA Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 3072-3078
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Timing Verification and Test Generation
Keyword: 
test generationacyclic sequential circuitsstuck-at faultpartial scanmultiple fault
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