Keyword : X-ray diffraction

Low-Temperature MBE Growth of a TlGaAs/GaAs Multiple Quantum-Well Structure
Naoki NISHIMOTO Nobuhiro KOBAYASHI Naoyuki KAWASAKI Yasuaki HIGUCHI Yasutomo KAJIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/10/01
Vol. E86-C  No. 10 ; pp. 2082-2084
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Microelectronics with TWHM2003)
Category: 
Keyword: 
TlGaAs, molecular-beam epitaxy, X-ray diffraction, quantum well, 
 Summary | Full Text:PDF
Effect of SiF4/SiH4/H2 Flow Rates on Film Properties of Low-Temperature Polycrystalline Silicon Films Prepared by Plasma Enhanced Chemical Vapor Deposition
Mikio MOHRI Hiroaki KAKINUMA Taiji TSURUOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/10/25
Vol. E77-C  No. 10 ; pp. 1677-1684
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
low-temperature poly-Si films, SiF4/SiH4/H2 gas flow rates, electrical property, X-ray diffraction, Raman spectra, 
 Summary | Full Text:PDF