Keyword : X-filling

A Don't Care Filling Method for Low Capture Power based on Correlation of FF Transitions Using SAT
Masayoshi YOSHIMURA Yoshiyasu TAKAHASHI Hiroshi YAMAZAKI Toshinori HOSOKAWA 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2824-2833
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
transition faults, correlation, capture power reduction, X-filling, SAT, 
 Summary | Full Text:PDF
Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures
Tian CHEN Dandan SHEN Xin YI Huaguo LIANG Xiaoqing WEN Wei WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/11/01
Vol. E99-D  No. 11 ; pp. 2672-2681
Type of Manuscript:  PAPER
Category: Computer System
Keyword: 
low power test, data compression, LFSR, X-filling, 
 Summary | Full Text:PDF
Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
Kohei MIYASE Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Yuta YAMATO Hiroshi FURUKAWA Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/06/01
Vol. E94-D  No. 6 ; pp. 1216-1226
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
ATPG, X-bit, X-identification, X-filling, 
 Summary | Full Text:PDF
Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power
Jun LIU Yinhe HAN Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/08/01
Vol. E93-D  No. 8 ; pp. 2223-2232
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
selective encoding, test data compression, test power reduction, flexible grouping, X-filling, 
 Summary | Full Text:PDF
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
Kohei MIYASE Xiaoqing WEN Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA Patrick GIRARD Laung-Terng WANG Mohammad TEHRANIPOOR 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 2-9
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
power supply noise, test relaxation, X-filling, clock-gating, test compaction, 
 Summary | Full Text:PDF
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4 ; pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power test, scan-based test, X-filling, test application time, 
 Summary | Full Text:PDF