Keyword : X-bit


A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution
Hiroshi YAMAZAKI Motohiro WAKAZONO Toshinori HOSOKAWA Masayoshi YOSHIMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 1994-2002
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
X-bitdon't care identificationX-bit distributiontest compaction
 Summary | Full Text:PDF(1.4MB)

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
Kohei MIYASE Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Yuta YAMATO Hiroshi FURUKAWA Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/06/01
Vol. E94-D  No. 6 ; pp. 1216-1226
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
ATPGX-bitX-identificationX-filling
 Summary | Full Text:PDF(2.6MB)

A Novel ATPG Method for Capture Power Reduction during Scan Testing
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/09/01
Vol. E90-D  No. 9 ; pp. 1398-1405
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF(1.6MB)