Keyword : VLSI test

Test Generation for Test Compression Based on Statistical Coding
Hideyuki ICHIHARA Atsuhiro OGAWA Tomoo INOUE Akio TAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1466-1473
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
VLSI testtest compressionstatistical codetest generationautomatic test equipment
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