Keyword : Tx leakage


Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip
Ryo MINAMI JeeYoung HONG Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1057-1060
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
CMOSpower amplifiersubstrate couplingTx leakagemutual coupling
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