Keyword : TEM


Three-Dimensionally Assembled TES X-ray Microcalorimeter Arrays for a TEM EDS System
Kenichiro NAGAYOSHI Kazuhiro SAKAI Kazuhisa MITSUDA Noriko Y. YAMASAKI Yoh TAKEI Keisuke MAEHATA Naoko IYOMOTO Shohei EZAKI Akira TAKANO Makoto MAEDA Toru HARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/03/01
Vol. E98-C  No. 3 ; pp. 186-191
Type of Manuscript:  Special Section PAPER (Special Section on Leading-Edge Applications and Fundamentals of Superconducting Sensors and Detectors)
Category: 
Keyword: 
TES microcalorimetersX-raysgamma-raysX-ray microanalysisTEMEDS
 Summary | Full Text:PDF | Errata [Uploaded on March 1, 2015]

Characterization of HfO2 Films Prepared on Various Surfaces for Gate Dielectrics
Takashi YAMAMOTO Yukiko IZUMI Naoyuki SUGIYAMA Kazuhiro YOSHIKAWA Hideki HASHIMOTO Yoshihiro SUGITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/01/01
Vol. E87-C  No. 1 ; pp. 17-23
Type of Manuscript:  Special Section PAPER (Special Section on High-κ Gate Dielectrics)
Category: 
Keyword: 
high-κ gate dielectricsHfO2ALDTEMSIMSXPSFT-IR ATREXAFS
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ECR-MBE Growth of GaN Using Hydrogen-Nitrogen Mixed Gas Plasma
Yasuo CHIBA Tsutomu ARAKI Yasushi NANISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/04/25
Vol. E83-C  No. 4 ; pp. 627-632
Type of Manuscript:  Special Section PAPER (Special Issue on Blue Laser Diodes and Related Devices/Technologies)
Category: 
Keyword: 
GaNhydrogenTEMcolumnar structure
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Hetero-Epitaxial PbZr0. 48Ti0. 52O3 Capacitors with Oxide Electrodes
Mitsuo SUGA Masahiko HIRATANI Choichiro OKAZAKI Masanari KOGUCHI Hiroshi KAKIBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 523-527
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
epitaxyTEMPZTSrRuO3SrTiO3
 Summary | Full Text:PDF

Microstructure Analysis Technique of Specific Area by Transmission Electron Microscopy
Yoshifumi HATA Ryuji ETOH Hiroshi YAMASHITA Shinji FUJII Yoshikazu HARADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 590-594
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
TEMFIBspecimen preparationcross-sectional specimen
 Summary | Full Text:PDF