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Time Dependent Percolation Analysis of the Degradation of Coherent Tunneling in Ultra-Thin CoFeB/MgO/CoFeB Magnetic Tunneling Junctions
Keiji HOSOTANI Makoto NAGAMINE Ryu HASUNUMA | Publication:
Publication Date: 2020/05/01
Vol. E103-C
No. 5 ;
pp. 254-262
Type of Manuscript:
PAPER
Category: Semiconductor Materials and Devices
Keyword:
STT-MRAM, MgO, TDDB, percolation, | | | Summary | Full Text:PDF | |
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A Study on Si(100) Surface Flattening Utilizing Sacrificial Oxidation Process and Its Effect on MIS Diode Characteristics
Sohya KUDOH Shun-ichiro OHMI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2015/05/01
Vol. E98-C
No. 5 ;
pp. 402-405
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
Si surface roughness, sacrificial oxidation, TDDB, | | | Summary | Full Text:PDF | |
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A New Technique for Evaluating Gate Oxide Reliability Using a Photon Emission Method
Yukiharu URAOKA Kazuhiko TSUJI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C
No. 4 ;
pp. 519-524
Type of Manuscript:
Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword:
reliability, photon emission, TDDB, gate oxide, LOCOS, | | | Summary | Full Text:PDF | |
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