Keyword : SoC testing


Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips
Thomas Edison YU Tomokazu YONEDA Krishnendu CHAKRABARTY Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10 ; pp. 2440-2448
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SoC testingtest architecture designtest schedulingthermal constraint
 Summary | Full Text:PDF(687.1KB)

NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
Fawnizu Azmadi HUSSIN Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7 ; pp. 2008-2017
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SoC testingNoC testingtest wrapper designNoC-compatible wrapper
 Summary | Full Text:PDF(950.4KB)