Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/25
Vol. E78-C
No. 3 ;
pp. 261-266
Type of Manuscript:
Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category:
Keyword:
MOSFET, transconductance, Si-SiO2 interface state, charge-to-breakdown, antenna effect, |
