Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C
No. 3 ;
pp. 314-319
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Interface and Interconnect Techniques
Keyword:
SerDes, BIST, at-speed testing, PRBS, multi-channel synchronization, |