Keyword : STM


Correlation between Contact Resistance Characteristics and Scanning Tunneling Microscopy Images for Ag-Pd Alloy with Some Example Additives
Terutaka TAMAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C  No. 8 ; pp. 1559-1565
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--)
Category: Contact Phenomena
Keyword: 
STMcontact resistanceAg-Pd-Cr alloyAg-Pd-Mg alloy
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DTM: Dynamic Transfer Mode Based on Dynamically Assigned Short-Hold Time-Slot Relay
Naoaki YAMANAKA Kohei SHIOMOTO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1999/02/25
Vol. E82-B  No. 2 ; pp. 439-446
Type of Manuscript:  PAPER
Category: Communication Networks and Services
Keyword: 
networkburstSTMtrafficswitch
 Summary | Full Text:PDF(724.4KB)

Room Temperature Operated Single Electron Transistor by STM Nano-Oxidation Process: Fabrication Process and Electrical Properties
Kazuhiko MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/11/25
Vol. E79-C  No. 11 ; pp. 1509-1514
Type of Manuscript:  INVITED PAPER (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
Category: 
Keyword: 
single electron transistorSTMnano-fabrication
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Morphological Study of YBa2Cu3Oy Thin Films Grown by Excimer Laser Ablation Method
Shingo TOMOHISA Hiroshi NAKATSUKA Minoru TACHIKI Takeshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9 ; pp. 1264-1268
Type of Manuscript:  Special Section PAPER (Special Issue on Toward Digital and Analog Applications of Superconductors)
Category: Device technology
Keyword: 
YBa2Cu3Oy excimer laserlaser ablationPLDeclipse methodSTMmigration laser plume
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Growth and Characterization of Nanometer-Scale GaAs, AlGaAs and GaAs/InAs Wires
Kenji HIRUMA Hisaya MURAKOSHI Masamitsu YAZAWA Kensuke OGAWA Satoru FUKUHARA Masataka SHIRAI Toshio KATSUYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/09/25
Vol. E77-C  No. 9 ; pp. 1420-1425
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Devices and Epitaxial Growth Techniques)
Category: 
Keyword: 
GaAsInAsquantum wirewhiskerSTM
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Evaluation of Si Surface Micro-Roughness by Measuring Chlorine Concentration and Total Charge of Native Oxide
Ichiro OKI Tetsuo BIWA Jun KUDO Hikou SHIBAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7 ; pp. 809-811
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
AFMSTMmicro-roughnessHCl/H2O2
 Summary | Full Text:PDF(468.8KB)