Keyword : STG

High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph
Eunjung OH Soo-Hyun KIM Dong-Ik LEE Ho-Yong CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A  No. 12 ; pp. 2674-2683
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Generation
asynchronous circuitsATPGSTG
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