Keyword : S-parameters


RFCV Test Structure Design for a Selected Frequency Range
Wutthinan JEAMSAKSIRI Abdelkarim MERCHA Javier RAMOS Stefaan DECOUTERE Florence CUBAYNES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 817-823
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
capacitanceCVgate dielectricimpedanceMOSFETnitrideoxideRFS-parameters
 Summary | Full Text:PDF

A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement
Ming-Hsiang CHO Guo-Wei HUANG Chia-Sung CHIU Kun-Ming CHEN An-Sam PENG Yu-Min TENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 845-850
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
automatic measurementcascade configurationon-wafer de-embeddingsiliconS-parameters
 Summary | Full Text:PDF

Microwave Frequency Model of FPBGA Solder Ball Extracted from S-Parameters Measurement
Junho LEE Seungyoung AHN Woon-Seong KWON Kyung-Wook PAIK Joungho KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/09/01
Vol. E87-C  No. 9 ; pp. 1621-1627
Type of Manuscript:  PAPER
Category: Electronic Components
Keyword: 
ball grid arrayfine pitched BGAlumped circuit modelmicrowave frequencyS-parameters
 Summary | Full Text:PDF