Keyword : S-parameter

S-Parameter Analysis for Balanced and Unbalanced Modes Corresponding Dissipated Power of a Small Antenna
Takashi YANAGI Yasuhiro NISHIOKA Toru FUKASAWA Naofumi YONEDA Hiroaki MIYASHITA 
Publication:   
Publication Date: 2020/07/01
Vol. E103-B  No. 7 ; pp. 780-786
Type of Manuscript:  PAPER
Category: Antennas and Propagation
Keyword: 
balanced mode, unbalanced mode, S-parameter, self-balancing, measurement, 
 Summary | Full Text:PDF(1.9MB)
Modeling of Bulk Current Injection Setup for Automotive Immunity Test Using Electromagnetic Analysis
Yosuke KONDO Masato IZUMICHI Kei SHIMAKURA Osami WADA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2015/07/01
Vol. E98-B  No. 7 ; pp. 1212-1219
Type of Manuscript:  Special Section PAPER (Special Section on Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'14/Tokyo)
Category: 
Keyword: 
conducted susceptibility, bulk current injection, S-parameter, electromagnetic analysis, 
 Summary | Full Text:PDF(3.1MB)
Fast S-Parameter Calculation Technique for Multi-Antenna System Using Temporal-Spectral Orthogonality for FDTD Method
Mitsuharu OBARA Naoki HONMA Yuto SUZUKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2012/04/01
Vol. E95-B  No. 4 ; pp. 1338-1344
Type of Manuscript:  PAPER
Category: Antennas and Propagation
Keyword: 
FDTD, OFDM, CI, S-parameter, multi-antenna, 
 Summary | Full Text:PDF(1.2MB)
A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement
Han-Yu CHEN Kun-Ming CHEN Guo-Wei HUANG Chun-Yen CHANG Tiao-Yuan HUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 726-732
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
threshold voltage, effective channel length, channel mobility, S-parameter, automatic measurement, 
 Summary | Full Text:PDF(532.5KB)
Automated Millimeter-Wave On-Wafer Testing System
Takayuki KATOH Takuo KASHIWA Hiroyuki HOSHI Akira INOUE Takahide ISHIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7 ; pp. 1312-1317
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: Measurements
Keyword: 
millimeter wave, S-parameter, noise figure, MMIC, on-wafer measurement, 
 Summary | Full Text:PDF(725.2KB)
A Precise Method for Determining AlGaAs/GaAs HBT Large-Signal Circuit Parameters Using Bias-Dependent Noise Parameters and Small-Signal S-Parameters
Jun-ichi SHIMIZU Nobuyuki HAYAMA Kazuhiko HONJO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C  No. 1 ; pp. 159-162
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
HBT, large-signal, S-parameter, noise parameters, small-signal, 
 Summary | Full Text:PDF(231.9KB)