Keyword : S-parameter


Modeling of Bulk Current Injection Setup for Automotive Immunity Test Using Electromagnetic Analysis
Yosuke KONDO Masato IZUMICHI Kei SHIMAKURA Osami WADA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2015/07/01
Vol. E98-B  No. 7 ; pp. 1212-1219
Type of Manuscript:  Special Section PAPER (Special Section on Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'14/Tokyo)
Category: 
Keyword: 
conducted susceptibilitybulk current injectionS-parameterelectromagnetic analysis
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Fast S-Parameter Calculation Technique for Multi-Antenna System Using Temporal-Spectral Orthogonality for FDTD Method
Mitsuharu OBARA Naoki HONMA Yuto SUZUKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2012/04/01
Vol. E95-B  No. 4 ; pp. 1338-1344
Type of Manuscript:  PAPER
Category: Antennas and Propagation
Keyword: 
FDTDOFDMCIS-parametermulti-antenna
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A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement
Han-Yu CHEN Kun-Ming CHEN Guo-Wei HUANG Chun-Yen CHANG Tiao-Yuan HUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 726-732
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
threshold voltageeffective channel lengthchannel mobilityS-parameterautomatic measurement
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Automated Millimeter-Wave On-Wafer Testing System
Takayuki KATOH Takuo KASHIWA Hiroyuki HOSHI Akira INOUE Takahide ISHIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7 ; pp. 1312-1317
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: Measurements
Keyword: 
millimeter waveS-parameternoise figureMMICon-wafer measurement
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A Precise Method for Determining AlGaAs/GaAs HBT Large-Signal Circuit Parameters Using Bias-Dependent Noise Parameters and Small-Signal S-Parameters
Jun-ichi SHIMIZU Nobuyuki HAYAMA Kazuhiko HONJO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C  No. 1 ; pp. 159-162
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
HBTlarge-signalS-parameternoise parameterssmall-signal
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