Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2013/10/01
Vol. E96-C
No. 10 ;
pp. 1227-1235
Type of Manuscript:
Special Section PAPER (Special Section on Emerging Technologies and Applications for Microwave and Millimeter-Wave Systems)
Category:
Keyword:
RF test, ATE, VCO, SIP, ΔΣ modulator, IIR filter, |